In order to improve the X-ray intensity of wire target driven by picosecond laser,a method of backlighting of static step wedge target by X-ray source generated by picosecond laser irradiating side radiation of self-sustaining independent wire target is proposed firstly,and experimental research is carried out on picosecond beam of the XGIII laser facility,China Academy of Engineering Physics.In this method,a picosecond laser is used to incident at 30° away from the target normal,and the X-ray source is generated by interacting of a laser with molybdenum and gold wire targets with a diameter of 10 μm.The X-ray source focal spot is measured by a multi-hole array pinhole and a CCD camera.The minimum transverse size of the focal spot of the X-ray source obtained is about 20 μm,and the longitudinal size is about 10 μm.The optimal spatial resolution of static target imaging is close to ~11 μm,which is comparable to the diameter of the wire target.The experimental results show that using the self-sustaining independent wire target side can obtain strong penetrability microfocus X-ray source.This method can provide reference for the research and application of high-energy density material dynamic process diagnosis.