铜辅助化学腐蚀条件对多孔硅的影响
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(1.集美大学 诚毅学院,福建厦门361021; 2.厦门大学 物理系 半导体光电材料及其高效 转 换器件协同创新中心,福建 厦门 361005)

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黄燕华(1980-),女,福建人,副教授,主要从事多孔硅、微 纳米材料制备、锂电子电池硅基负极材料的研究.

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国家自然科学基金(61534005)和福建省中青年教师教育科研(JA15651)资助项目 (1.集美大学 诚毅学院,福建厦门361021; 2.厦门大学 物理系半导体光电材料及其高效 转换器件协同创新中心,福建 厦门 361005)


Influence of Cu-assisted chemical etching preparation condition on the morpholo gy of porous silicon
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(1.Chengyi University College,Jimei University,Xiamen 361021,China; 2.Fujian Provincial Key Laboratory of Semiconductors and Applications,Collabora t ive Innovation,Center for Optoelectronic Semiconductors and Efficient Devices,De partment of Physics,Xiamen University,Xiamen 361005,China)

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    摘要:

    以铜(Cu)作为催化剂,采用两步化学腐蚀法成功制 备了微纳米多孔硅(PS)。本文方法成本低廉、操 作简易。系统研究了腐蚀液中H2O2浓度、Si衬底掺杂浓度、腐蚀液温度和腐 蚀时间对PS表 面形貌和腐蚀深度的影响,并得到最佳制备参数。高、低掺Si衬底所采用的最佳配比腐蚀液 中的H2O2浓度分 别达到0.70mol/L和0.24mol/L。在 25℃腐蚀液中,腐蚀2h得到约200nm深的纳米级孔洞 ,其表面反射率在 宽波段内降低到5%以下;而在50℃腐蚀液中,经过2~ 4h的腐蚀,可得到14~41μm深的结构稳定的微纳 米级孔洞。文中还对Cu辅助腐蚀与其他金属辅助腐蚀(MACE)作了对比,分析了Cu辅助腐蚀获 得锥状孔洞的原因和机理。

    Abstract:

    Porous silicon with micro-nano sizes has been prepared by the metal- assisted chemical etching approach with Cu nanoparticles as the catalyst agents.This method has the advan tages of low cost and simple operation.The effects of the preparation condition on the morphologies and etch ing depth of the porous structures is discussed,such as the concentration of H2O2,th e doping level of silicon substrate, the temperature of etching solution and the etching time.An optimal etching con dition is obtained,the concentration of H2O2in the reactant is more than 0.70mol/L for highly dop ed silicon substrate,and more than 0.24mol/L for lightly doped silicon substrate.Nano porous structures with layer thickness about 200nm are obtained after etching for 2h at the temperature of 25℃.The average surface r eflectivity of the prepared nanostructures is under 5% for the wide band.While at the optimal temperature of 50℃,stable structures of micro-nano porous silicon with depth about 14-41μm are achieved after etchin g for about 2-4h.The formation mechanism of the surface morphology of the Si wafers under different reactant co ncentrations can be explained with the hole injection model.The action of Cu and other metals on the etching is studied,and the formation of the pores with cubic cone shape is also analyz ed.

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黄燕华,韩响,陈松岩.铜辅助化学腐蚀条件对多孔硅的影响[J].光电子激光,2017,28(10):1101~1107

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  • 收稿日期:2017-03-21
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  • 在线发布日期: 2017-10-23
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