The extreme ultraviolet (EUV) solar telescope is one of the most important instr uments to observe the solar dynamics. Fe-IX/X (λ=17.1nm) and He-II (λ=30.4nm) are fundamental spectral lines to the research of solar corona and are always be chosen by the EUV normal incidence solar telescope.A kind of mult ilayer was designed in order to realize reflecting 17.1nm and 30.4nm spectral at one mirror.According to the chosen principle of the EUV band,three materials,namely Si,B₄C and Mo,are chosen to form two superposed perio d multilayers.The number of the periods and film thickness are optimized.The reflectivity of the optimized mul tilayer is calculated by computer.The feasibility of reflecting 17.1nm and 30. 4nm at one mirror has been proved in theory.The multilayer is deposited on silicon slice by magnetron sputtering coating machine.The mult ilayer is measured by laser-plasma reflectometer.The results show that the reflectivities of the mul tilayer at 17.1nm and 30.4nm are 19.9% and 20.2%,respectively.Using correct filter,such as Mg filter or Zr filt er,can reflect the single spectral line at 17.1nm or 30.4nm.