基于Compton散射的缺陷检测研究
DOI:
CSTR:
作者:
作者单位:

作者简介:

通讯作者:

中图分类号:

TN247

基金项目:


The Research on Defect Inspection Based on Compton Scattering
Author:
Affiliation:

Fund Project:

  • 摘要
  • |
  • 图/表
  • |
  • 访问统计
  • |
  • 参考文献
  • |
  • 相似文献
  • |
  • 引证文献
  • |
  • 资源附件
  • |
  • 文章评论
    摘要:

    从工程应用的角度出发介绍了一种较新的无损检测方法,即利用Compton散射进行工件内部的缺陷检测,指出了利用Compton散射进行缺陷检测的意义,分析了其检测原理和数学模型,采用真空电离室对其进行也初步实验,对实验结果进行了分析。并指出了进上步的研究重点和应用前景,实际表明,Compton散射法检测具有结构灵活、灵敏度高等优点,在一些特殊卖命具有独到的优势,积极开展这方面的应用研究具有明显的研究意

    Abstract:

    A new non-destructive testing techn iq ue is investigated from the point of view of engineering application,that is the defect inspection in workpiece by Compton scattering.The significance of Compto n scattering for defect inspection is pointed out.The inspecting principle and t he mathematical model are analyzed.Meanwhile,the vacuum ionization chamber is em ployed for the primary experiment of Compton scattering inspection with the expe riment results analyzed.Moreover,the research emphasis and the applying outlook are pointed out.It is indicated through practice that the Compton scattering tec hnique processes the advantage of flexible structure and high sensitivity,which is unique predominance in some special cases.It goes without saying that it is v ery significant to carry out further research for application.

    参考文献
    相似文献
    引证文献
引用本文

任大海 尤政.基于Compton散射的缺陷检测研究[J].光电子激光,2000,(3):303~305

复制
分享
文章指标
  • 点击次数:
  • 下载次数:
  • HTML阅读次数:
  • 引用次数:
历史
  • 收稿日期:
  • 最后修改日期:1999-09-04
  • 录用日期:
  • 在线发布日期:
  • 出版日期:
文章二维码