In Ref. a method of screening optoelectronic coupled devices(OCD) by use of measuring noise power spectrum is proposed.However,in recent experiment it is found that the correlation between low frequency noise(1/f),generation recombination(gr) noise and burst noise is rather weak.When the devices with heavy 1/f noise are rejected,the other devices with gr noise or burst noise can still be left without being screened off.For this reason,in the course of screening the conditions of rejecting devices with gr or burst noises should be included,which can not only improve the reliability of screening devices,but also a more reliable screening method is presented for the case of higher reliability and quality required in rejecting semiconductor devices.