高能N等离子源辅助GaN薄膜生长及其物性研究
Studies on the growth and physical properties of GaN thin films assisted by high-energy N plasma sources
投稿时间:2024-02-01  修订日期:2024-03-31
DOI:
中文关键词:  等离子增强化学气相沉积  GaN薄膜  低温沉积  N等离子体
英文关键词:PECVD  GaN film  low-temperature deposition  N plasma
基金项目:
作者单位邮编
胡海争* 浙江理工大学 310018
贺怀乐 浙江理工大学 
王顺利 浙江理工大学 
吴超 浙江理工大学 
郭道友 浙江理工大学 
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中文摘要:
      GaN具有宽带隙、高量子效率、优异的热稳定和抗辐射等特性,在高频、高功率电子及紫外光电器件中有着重要的作用。在本工作中,采用绿色、低成本的等离子增强化学气相沉积(plasma-enhanced chemical vapor deposition, PECVD)方法,通过使用高能N等离子体作为N源,在较低温度(850 ℃)下成功制备了高结晶质量的GaN薄膜,并研究了N2流量对薄膜结晶质量、生长速率和光学性能的影响。结果表明,随着N2流量的增加,反应原子的动能提高,薄膜生长速度和结晶质量得以提升。但随着N2流量进一步增加,过高的成核率会导致衬底吸附的原子无法迁移到适当的位置,薄膜沿着不同的方向上随机生长,晶体质量下降。本文制备的GaN薄膜的载流子浓度达到2.19×1018 cm-3,迁移率达到5.17 cm2V-1S-1,在光电子器件中展现出具有较强的应用潜力。
英文摘要:
      GaN with a wide band gap, high quantum efficiency, excellent thermal stability, and radiation resistance is important role in high frequency, high power electronics, and UV photoelectron devices. In this study, we present a novel approach by utilizing high-energy N plasma as the nitrogen source for synthesizing the GaN films with higher quality crystalline. This process occurs at a relatively low temperature of 850 °C, utilizing the economical and eco-friendly PECVD method. Furthermore, the effects of Nitrogen flux on the growth dynamics, optical characteristics, and crystallinity of the films are investigated. The results reveal that an increase in N plasma flux enhances both the film growth rate and crystalline quality by boosting the kinetic energy of reacting atoms. Nevertheless, a further increase in N plasma flux results in excessive nucleation, preventing atoms adsorbed on the substrate from migrating to appropriate positions. Consequently, the films grow in random directions, leading to a decline in crystalline quality. The GaN films prepared in this study achieved a carrier concentration of 2.19×1018 cm-3 and mobility of 5.17 cm2V-1s-1, demonstrating significant potential for optoelectronic device applications.
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